The 17th MCM showcased the latest advancements in microscopy techniques (scanning and transmission electron microscopy, fluorescence and super-resolution microscopy, X-ray-based imaging techniques, diffraction imaging techniques), sample preparation methods, and microscopy data analysis. It was also an opportunity to meet representatives from companies developing instruments and software.
The congress provided an excellent opportunity for attendees to network with colleagues from around the world and to present their work and the All-Micro project to the scientific community.
ALL-MICRO poster
poster UniTs
talk CNR-IOM
